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dc.creatorGarcia, Richard Michaelen_US
dc.descriptionDue to the character of the original source materials and the nature of batch digitization, quality control issues may be present in this document. Please report any quality issues you encounter to, referencing the URI of the item.en_US
dc.descriptionIncludes bibliographical references (leaves 31-32).en_US
dc.descriptionIssued also on microfiche from Lange Micrographics.en_US
dc.description.abstractSeveral time-of-flight backscattering spectrometry experiments using singly ionized neon for purposes of analyzing a bismuth coated silicon target were conducted. This work builds upon prior work, done with lighter ions, with the goal of comparing the observed system resolutions with those obtained previously in similar analyses. Discriminator thresholds, electronic start/stop logic, aperture sizes, target tilt and beam energies were varied and studied to determine their effect on system resolution. Depth resolutions below 10 A[], energy resolutions less than 1 keV and sensitivities of 10¹¹ (atoms/cm²)were attained. Comparison to prior research indicates the depth resolutions are significantly improved while energy resolutions are slightly improved. However, there does appear to be room to further improve upon these results. This work also indicates the presence of a previously unobserved and unexpected target tail feature on the analysis spectra. A possible cause for the tail feature is suggested and recommendations are given for further research to both improve the system resolution and to further analyze the tail feature.en_US
dc.publisherTexas A&M Universityen_US
dc.rightsThis thesis was part of a retrospective digitization project authorized by the Texas A&M University Libraries in 2008. Copyright remains vested with the author(s). It is the user's responsibility to secure permission from the copyright holder(s) for re-use of the work beyond the provision of Fair Use.en_US
dc.subjectnuclear engineering.en_US
dc.subjectMajor nuclear engineering.en_US
dc.titleNeon time-of-flight backscattering spectrometry for surface analysisen_US
dc.typeThesisen_US engineeringen_US
dc.format.digitalOriginreformatted digitalen_US

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