Abstract
Scanning electron microscopy was used to investigate morphological features of a diverse range of pillared layered materials. Pillared layered zirconium phosphates, zirconium polyimine phosphonates and anion exchanger derivatives, zinc organophosphonates, antimony phosphates and layered titanates are among the groups of solids examined. scanning electron microscope images revealed morphological characteristics showing differences of surface areas and pore size between the diverse materials investigated. Correlation with the X-ray powder diffraction data and other analytical data was discussed. In most of the cases, the features observed in the images of these layered material were in agreement with the morphology expected from the X-ray powder diffraction data.
Navas de Mascianglioli, Margarit (1993). Morphological properties of pillared layered materials investigated by electron microscopy technique. Master's thesis, Texas A&M University. Available electronically from
https : / /hdl .handle .net /1969 .1 /ETD -TAMU -1993 -THESIS -N322.