Nanoscale characterization of solution-cast poly(vinylidene fluoride) thinfilms using atomic force microscopy
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This thesis research focuses on the characterization of thinfilms made of poly(vinylidene fluoride) (PVDF) using an atomic force microscope. Thinfilms of PVDF were fabricated by a spin coating method with different conditions and characterized using the Atomic Force Microscopy (AFM) for morphological changes. Phase and conformational changes of PVDF were investigated using both wide angle X-ray diffraction (WAXD) and Fourier Transform Infrared Spectroscopy (FTIR). From this analysis, in-situ corona poling with annealing of spin-cast PVDF enabled a phase change from ÃÂ± to the mixture of ÃÂ² and ÃÂ³ phases. This process can decrease the complexity of the conventional method which requires mechanical stretching before poling PVDF in addition to thermal annealing for ÃÂ² phase transformation. This thesis describes some materials and surface properties of solution-cast PVDF thinfilms with various conditions such as topography and phase image, adhesion force, friction force, and roughness. Through the AFM topography and phase images, polymeric behavior and spherulites are discussed in the later part of the thesis.
Jee, Tae Kwon (2005). Nanoscale characterization of solution-cast poly(vinylidene fluoride) thinfilms using atomic force microscopy. Master's thesis, Texas A&M University. Texas A&M University. Available electronically from