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dc.creatorDewitt, D. R.en_US
dc.creatorSchneider, D.en_US
dc.creatorChen, M. H.en_US
dc.creatorSchneider, M. B.en_US
dc.creatorChurch, David A.en_US
dc.creatorWeinberg, G.en_US
dc.creatorSakurai, M.en_US
dc.date.accessioned2011-09-08T21:35:44Z
dc.date.available2011-09-08T21:35:44Z
dc.date.issued1993en_US
dc.identifier.citationD. R. Dewitt, D. Schneider, M. H. Chen, M. B. Schneider, David A. Church, G. Weinberg and M. Sakurai. Phys.Rev.A 47 R1597-R1600 1993. "Copyright (1993) by the American Physical Society."en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevA.47.R1597en_US
dc.identifier.urihttp://hdl.handle.net/1969.1/126526
dc.descriptionJournals published by the American Physical Society can be found at http://publish.aps.org/en_US
dc.description.abstractMeasurements of relative dielectronic recombination (DR) cross sections for fluorinelike xenon (Xe45+) are presented. Recombination takes place in an electron-beam ion trap, where decay rates are obtained as the ions recombine with beam electrons. Experimental data are obtained by counting the number of ions that remain, as a function of time, following the recombination period. The counting is accomplished through the use of an ion-extraction system. An ultralow beam current, 2 mA, was used to obtain an energy resolution of 10.6 eV full width at half maximum. The experimentally measured resonances are compared to convolved theoretical DR resonance strengths. The agreement with theory is excellent.en_US
dc.language.isoenen_US
dc.publisherAmerican Physical Societyen_US
dc.subjectELECTRON-IMPACT EXCITATIONen_US
dc.subjectHIGHLY CHARGED IONSen_US
dc.subjectARGONen_US
dc.subjectOXYGENen_US
dc.subjectTRAPen_US
dc.subjectOpticsen_US
dc.subjectPhysics, Atomic, Molecular and Chemicalen_US
dc.titleDielectronic Recombination Cross-Sections of Fluorinelike Xenonen_US
dc.typeArticleen_US
local.departmentPhysics and Astronomyen_US


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