Dielectronic Recombination Cross-Sections of Fluorinelike Xenon
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Measurements of relative dielectronic recombination (DR) cross sections for fluorinelike xenon (Xe45+) are presented. Recombination takes place in an electron-beam ion trap, where decay rates are obtained as the ions recombine with beam electrons. Experimental data are obtained by counting the number of ions that remain, as a function of time, following the recombination period. The counting is accomplished through the use of an ion-extraction system. An ultralow beam current, 2 mA, was used to obtain an energy resolution of 10.6 eV full width at half maximum. The experimentally measured resonances are compared to convolved theoretical DR resonance strengths. The agreement with theory is excellent.
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HIGHLY CHARGED IONS
Physics, Atomic, Molecular and Chemical