Now showing items 1-2 of 2

    • Approaches to test set generation using binary decision diagrams 

      Wingfield, James (Texas A&M University, 2004-09-30)
      This research pursues the use of powerful BDD-based functional circuit analysis to evaluate some approaches to test set generation. Functional representations of the circuit allow the measurement of information about ...
    • Pseudofunctional Delay Tests For High Quality Small Delay Defect Testing 

      Lahiri, Shayak (2012-02-14)
      Testing integrated circuits to verify their operating frequency, known as delay testing, is essential to achieve acceptable product quality. The high cost of functional testing has driven the industry to automatically-generated ...